RF (gigahertz) ATE production testing on wafer: options and tradeoffs
نویسنده
چکیده
Why RF test on-wafer? Introduction The ever-increasing demand for more bandwidth to support the exploding Internet and the insatiable need for PCS (personal communication systems)/cellular devices has driven manufacturers of high speed digital and RF devices to push RF test of these devices upstream to the wafer level for a variety of reasons. Internet user demand for bandwidth is doubling every four months, while providers are only able to double bandwidth access every fourteen months. Worldwide sales of cellular telephones were in the hundreds of millions in 1998. The high volume demand of these devices necessitates the most economical production path to market.
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تاریخ انتشار 1999